STM studies of Si(100)-2×1 oxidation: defect chemistry and Si ejection
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 838-844
- https://doi.org/10.1016/0304-3991(92)90366-r
Abstract
No abstract availableKeywords
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