Piezoresistance in Heavily Doped-Type Germanium
- 1 August 1958
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 111 (3) , 798-802
- https://doi.org/10.1103/physrev.111.798
Abstract
Piezoresistance has been measured as a function of temperature in -type germanium specimens with donor concentrations between 6× and 3× . The results obtained can be explained on the basis of the accepted multivalley model, provided that statistical degeneracy is taken into account. An analysis of the degeneracy observed in the data provides strong evidence for the four-ellipsoid model of the conduction band. The data are consistent with the assumption that there is no appreciable dependence of the effective mass, deformation potential constant, and mobility anisotropy factor on the Fermi level or impurity density. No piezoresistance effect due to the (100) valleys is detected, showing that these valleys are at least 0.11 ev above the minima of the (111) valleys.
Keywords
This publication has 12 references indexed in Scilit:
- Magnetoresistance Symmetry Relation in-GermaniumPhysical Review B, 1958
- Magnetic Susceptibility of GermaniumPhysical Review B, 1957
- Temperature Dependence of the Piezoresistance of High-Purity Silicon and GermaniumPhysical Review B, 1957
- Weak Field Magnetoresistance of-Type GermaniumPhysical Review B, 1956
- Temperature Dependence of the Elastoresistance in-Type GermaniumPhysical Review B, 1955
- Magnetic Indications of Electronic Structure of the Conduction Band in GePhysical Review B, 1955
- Cyclotron Resonance of Electrons and Holes in Silicon and Germanium CrystalsPhysical Review B, 1955
- Piezoresistance Effect in Germanium and SiliconPhysical Review B, 1954
- Anisotropy of cyclotron resonance in germaniumPhysica, 1954
- The Magneto-Resistance Effect in Oriented Single Crystals of GermaniumPhysical Review B, 1951