The state of the art of flicker frequency noise in BAW and SAW quartz resonators
- 1 May 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
- Vol. 35 (3) , 406-420
- https://doi.org/10.1109/58.20462
Abstract
Experimental results of the last 15 years are reviewed. Noise properties of crystal filters and oscillators are reported, along with practical measurements. It is shown that the additional phase fluctuations are compensated by frequency fluctuations and vice versa. With the assistance of these theoretical results the flicker and white frequency noise coefficients, h(-1) and h(0), respectively, are plotted versus unloaded Q and carrier frequency f(0) for the measured and published crystal oscillator noise characteristics. The dependence of h(-1) approximately 10(-12.75) Q(2) (u) is verified.Keywords
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