In situ high-resolution electron microscopy reactions in semiconductors
Open Access
- 1 January 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 23 (3-4) , 383-395
- https://doi.org/10.1016/0304-3991(87)90249-x
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Radiation damage and structural studies: Halogenated phthalocyaninesUltramicroscopy, 1986
- High-resolution transmission electron microscopy of silicon re-growth at controlled elevated temperaturesNature, 1986
- Structural instability of ultrafine particles of metalsPhysical Review Letters, 1986
- High-resolution electron microscopic studies of chemical reactions in thin filmsUltramicroscopy, 1985
- Direct imaging of a novel silicon surface reconstructionPhysical Review Letters, 1985
- Imaging of atomic clouds outside the surfaces of gold crystals by electron microscopyNature, 1985
- Direct surface imaging in small metal particlesNature, 1983
- Dynamic observation of defect annealing in CdTe at lattice resolutionNature, 1982
- Atomic motion on the surface of a cadmium telluride single crystalNature, 1981
- Direct Observations of the Arrangement of Atoms around Stacking Faults and Twins in Gold Crystals and the Movement of Atoms Accompanying Their Formation and DisappearanceJapanese Journal of Applied Physics, 1980