In situ monitoring of the c( 4 × 4) to the 2 × 4 surface phase transformation on GaAs(001) by grazing incidence X-ray diffraction
- 1 December 1994
- journal article
- Published by Elsevier in Surface Science
- Vol. 320 (3) , 252-258
- https://doi.org/10.1016/0039-6028(94)90313-1
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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