Comparison of magnetic images using point and thin-film magnetic force microscopy tips
- 1 January 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 35 (5) , 3989-3991
- https://doi.org/10.1109/20.800731
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Development of high coercivity magnetic force microscopy tipsJournal of Magnetism and Magnetic Materials, 1998
- Magnetic force microscopy of thin film media for high density magnetic recordingJournal of Magnetism and Magnetic Materials, 1998
- Optimizing the NIST magnetic imaging reference sampleIEEE Transactions on Magnetics, 1997
- Growth and patterning of amorphous FeSiBC filmsJournal of Magnetism and Magnetic Materials, 1996
- Magnetic domain structure in ultrathin Cu/Ni/Cu/Si(001) films (invited)Journal of Applied Physics, 1996
- Superparamagnetic magnetic force microscopy tipsJournal of Applied Physics, 1996
- Magnetic force microscopy using electron-beam fabricated tipsReview of Scientific Instruments, 1994
- High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force MicroscopeJapanese Journal of Applied Physics, 1994
- Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopySurface Science, 1993
- Batch fabricated sensors for magnetic force microscopyApplied Physics Letters, 1990