Analyse des formes de relation existant entre variation de fréquence ou de période d'un quartz oscillant et caractéristiques du dépôt
- 1 June 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 16 (3) , 305-312
- https://doi.org/10.1016/0040-6090(73)90084-9
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Quartz Resonators; Reduction of Transient Frequency Excursion Due to Temperature ChangeJournal of Applied Physics, 1963
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- Verwendung von Schwingquarzen zur W gung d nner Schichten und zur Mikrow gungThe European Physical Journal A, 1959
- Perfection of contour by vacuum deposited thin filmsVacuum, 1954