Microstructure of thesurface
- 12 February 2002
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 65 (11) , 115401
- https://doi.org/10.1103/physrevb.65.115401
Abstract
The microstructure of the surface has been investigated by means of He-atom scattering (HAS), low energy electron diffraction (LEED), atomic force microscopy, and x-ray photoelectron spectroscopy. Heating the samples at 1600 K in air results in atomically smooth surfaces which are, however, covered by a carbon layer. No diffraction pattern could be obtained for these contaminated surfaces. Additional cleaning by sputtering and annealing under UHV conditions yielded highly ordered surfaces characterized by a well defined diffraction pattern in HAS and LEED. Annealing above 1400 K caused a structural transition to a phase, which is characterized by an ordered arrangement of oxygen vacancies. At room temperature the surface was found to be unreactive with regard to molecular and, surprisingly, atomic hydrogen.
Keywords
This publication has 27 references indexed in Scilit:
- Adsorption probability of CO on a metal oxide: The case of oxygen-terminated ZnO and the influence of defectsPhysical Review B, 2000
- Atomic structure of epitaxial Nb-Al2O3interfaces I. Coherent regionsPhilosophical Magazine A, 1997
- Atomic-scale formation of ultrasmooth surfaces on sapphire substrates for high-quality thin-film fabricationApplied Physics Letters, 1995
- High-power InGaN/GaN double-heterostructure violet light emitting diodesApplied Physics Letters, 1993
- Sapphire (112¯0) surface: Structure and laser-induced desorption of aluminumPhysical Review B, 1992
- Surface structure of the α-Al2O3 single crystals: Indexing the facets with computer simulationUltramicroscopy, 1990
- Magnetic and Structural Properties of Single-Crystal Rare-Earth Gd-Y SuperlatticesPhysical Review Letters, 1985
- Periodic lattice distortions in epitaxial films of Fe(110) on W(110)Surface Science, 1982
- Silicon-on-Sapphire Epitaxy by Vacuum Sublimation: LEED–Auger Studies and Electronic Properties of the FilmsJournal of Vacuum Science and Technology, 1971
- LEED Studies of the (0001) Face of α-AluminaJournal of Applied Physics, 1968