Hierarchical test generation using precomputed tests for modules
- 1 June 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 9 (6) , 594-603
- https://doi.org/10.1109/43.55189
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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