Functional Level Primitives in Test Generation
- 1 March 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-29 (3) , 223-235
- https://doi.org/10.1109/tc.1980.1675554
Abstract
This paper deals with the use and development of high-level (functional) primitive logic elements for use in a system which automatically generates tests for complex sequential circuits. The concept of solution sequences to test problems for primitive elements is introduced and a functional language used to describe solution sequences is presented. Functional test generation models for two basic elements, a shift register and a counter, are derived, including procedures for implication, D-drive and line justification. Primitive algorithms which generate single as well as multivector (sequences) solutions to D-drive and line justification problems are presented.Keywords
This publication has 4 references indexed in Scilit:
- On the Three-Valued Simulation of Digital SystemsIEEE Transactions on Computers, 1976
- Diagnosis & Reliable Design of Digital SystemsPublished by Springer Nature ,1976
- A Note on Three-Valued Logic SimulationIEEE Transactions on Computers, 1972
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967