Modelling of ellipsometric data of inhomogeneous TiO2 films
- 1 October 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 234 (1-2) , 458-462
- https://doi.org/10.1016/0040-6090(93)90307-b
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Automatic characterization of layers stacks from reflectivity measurements. Application to the study of the validity conditions of grazing X-rays reflectometryJournal of Optics, 1990
- Ellipsometric calculations for nonabsorbing thin films with linear refractive-index gradientsJournal of the Optical Society of America A, 1990
- Comparison of the properties of titanium dioxide films prepared by various techniquesApplied Optics, 1989
- Simultaneous determination of refractive index, its dispersion and depth-profile of magnesium oxide thin film by spectroscopic ellipsometryApplied Optics, 1989
- Simultaneous determination of dispersion relation and depth profile of thorium fluoride thin film by spectroscopic ellipsometryThin Solid Films, 1988
- Automatic determination of the optical constants of inhomogeneous thin filmsApplied Optics, 1982
- Refractive indices of TiO_2 films produced by reactive evaporation of various titanium–oxygen phasesApplied Optics, 1976