Distribution energetique des etats de surface a l'interface Si SiO2 effet de differents traitements
- 1 August 1970
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 8 (15) , 1173-1177
- https://doi.org/10.1016/0038-1098(70)90354-6
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Lateral AC current flow model for metal-insulator-semiconductor capacitorsIEEE Transactions on Electron Devices, 1965
- Dispersion and Absorption in Dielectrics I. Alternating Current CharacteristicsThe Journal of Chemical Physics, 1941