Electron paramagnetic resonance study of defects in oxidized and nitrided porous Si and Si1−xGex
- 1 August 1996
- journal article
- Published by Elsevier in Colloids and Surfaces A: Physicochemical and Engineering Aspects
- Vol. 115, 277-289
- https://doi.org/10.1016/0927-7757(96)03604-7
Abstract
No abstract availableKeywords
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