Deep-level transient spectroscopy measurements of majority carrier traps in neutron irradiated n-type silicon detectors
- 1 July 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 279 (1-2) , 277-280
- https://doi.org/10.1016/0168-9002(89)91093-0
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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