Stabilisation électrique de films résistants en zinc pulvérisé
- 1 March 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 15 (3) , 259-273
- https://doi.org/10.1016/0040-6090(73)90182-x
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Electromigration Damage in Thin Films due to Grain Boundary Grooving ProcessesJournal of Applied Physics, 1971
- Influence de la température sur la cinétique de condensation de couches minces pulvériséesThin Solid Films, 1971
- Theory of thin film condensation Part D: Influence of a variable collision factorThin Solid Films, 1971
- Photoconduction, Trapping, and Chemisorption Effects in Sputtered Niobium Oxide FilmsJournal of Applied Physics, 1970
- The variation of resistance of gold films with time and annealing procedureThin Solid Films, 1969
- Mécanismes de “germination-croissance” de couches minces métalliques synthétisées par condensation de plasmas froidsThin Solid Films, 1969
- Correlation between Hall effect changes due to gas chemisorption and the thickness dependence of the Hall coefficient in thin metallic filmsThin Solid Films, 1969
- Dielectric Properties of Unsintered Barium TitanateJournal of Applied Physics, 1969
- Propriétés électriques et optiques de structures tunnel métal-diélectrique-métalJournal de Physique, 1967
- Ion Transport Phenomena in Insulating FilmsJournal of Applied Physics, 1965