Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction
- 30 September 1991
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 79 (11) , 923-928
- https://doi.org/10.1016/0038-1098(91)90444-z
Abstract
No abstract availableKeywords
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