Microstructural investigation of Cu/Co multilayer films
- 1 September 1999
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 270 (1) , 69-74
- https://doi.org/10.1016/s0921-5093(99)00240-3
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Field Ion Microscopy of Multilayer Film DevicesMicroscopy and Microanalysis, 1998
- Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAPApplied Surface Science, 1996
- Giant Magnetoresistance in Magnetic NanostructuresAnnual Review of Materials Science, 1995
- Spin-valve RAM cellIEEE Transactions on Magnetics, 1995
- Design, fabrication and testing of spin-valve read heads for high density recordingIEEE Transactions on Magnetics, 1994
- The effects of annealing on magnetic domain structure and interface profile in sputtered Fe/Cr multilayer filmsJournal of Magnetism and Magnetic Materials, 1993
- A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin filmsApplied Surface Science, 1993
- Atom probe analysis and modelling of interfaces in magnetic multilayersUltramicroscopy, 1992
- Giant magnetoresistance in antiferromagnetic Co/Cu multilayersApplied Physics Letters, 1991
- Oscillatory magnetic exchange coupling through thin copper layersPhysical Review Letters, 1991