SEC-BED-DED Codes for Error Control in Byte-Organized Memory Systems
- 1 June 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-34 (6) , 557-562
- https://doi.org/10.1109/tc.1985.5009409
Abstract
SEC-ED-DED codes are single error correcting and double error detecting while simultaneously providing byte error detection. SEC-BED-DED codes are constructed for byte lengths of 5 and larger. For many byte lengths and code lengths, these codes require fewer check bits or have implementation advantages when compared to other SEC-BED-DED codes.Keywords
This publication has 11 references indexed in Scilit:
- A Class of Odd-Weight-Column SEC-DED-SbED Codes for Memory System ApplicationsIEEE Transactions on Computers, 1984
- Error-Correcting Codes with Byte Error-Detection CapabilityIEEE Transactions on Computers, 1983
- Code Constructions for Error Control in Byte Organized Memory SystemsIEEE Transactions on Computers, 1983
- Acceptable Testing of VLSI Components Which Contain Error CorrectorsIEEE Transactions on Computers, 1980
- Erasure and Error Decoding for Semiconductor MemoriesIEEE Transactions on Computers, 1978
- A Class of Linear Codes for Error Control in Byte-per-Card Organized Digital SystemsIEEE Transactions on Computers, 1978
- Measurement and Generation of Error Correcting Codes for Package FailuresIEEE Transactions on Computers, 1978
- Error-Correcting Codes for Byte-Organized Arithmetic ProcessorsIEEE Transactions on Computers, 1975
- A General Class of Maximal Codes ror Computer ApplicationsIEEE Transactions on Computers, 1972
- A Class of Optimal Minimum Odd-weight-column SEC-DED CodesIBM Journal of Research and Development, 1970