Study of the optical transitions in poly- and micro-crystalline Si by spectroscopic ellipsometry
- 31 December 1988
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 68 (12) , 1075-1079
- https://doi.org/10.1016/0038-1098(88)90825-3
Abstract
No abstract availableKeywords
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