Rutherford backscattering spectroscopy of rough films: Experimental aspects

This publication has 9 references indexed in Scilit:

• Rutherford backscattering spectroscopy of rough films: Theoretical considerations
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1997
• Thin-Film Morphology and Rutherford Backscattering Spectrometry
  Materials Science Forum, 1997
• Irradiation effects in Ag-Fe bilayers: Ion-beam mixing, recrystallization, and surface roughening
  Physical Review B, 1996
• Thin CuInS2 films by three-source molecular beam deposition
  Thin Solid Films, 1995
• A semiautomatic algorithm for rutherford backscattering analysis
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• Algorithms for the rapid simulation of Rutherford backscattering spectra
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
• Energy calibration of the 500 kV heavy ion implanter ionas
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
• Determination of concentration profile in thin metallic films: Applications and limitations of He+ backscattering
  Thin Solid Films, 1975
• Energy straggling ofHe4ions below 2.0 MeV in Al, Ni, and Au
  Physical Review B, 1975