Structural characterization of a CuO/MgO artificially superstructured film by the x-ray diffraction method

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Abstract
A CuO/MgO epitaxial artificially superstructured film [CuO(50 Å)/MgO(40 Å)]40 was successfully grown and its structure was studied by x‐ray diffraction (XRD). The film was found to have a texture in which the (111) planes of monoclinic CuO and the (001) planes of cubic MgO were layered perpendicular to the film plane. Its lateral structure was revealed by precession photographs where the CuO [101̄] axis is oriented approximately along the MgO [100] axis in the film plane. The XRD pattern, observed over a wide range of scattering vectors perpendicular to the film plane, was carefully analyzed by an extended step model. The fluctuation of the superlattice period was estimated to be as small as 1 Å.

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