34.4: Invited Paper: Microcrystalline Silicon: An emerging Material for Stable Thin Film Transistors
- 1 May 2003
- journal article
- Published by Wiley in SID Symposium Digest of Technical Papers
- Vol. 34 (1) , 1096-1099
- https://doi.org/10.1889/1.1832479
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Ion bombardment effects on microcrystalline silicon growth mechanisms and on the film propertiesJournal of Applied Physics, 2003
- Plasma enhanced chemical vapor deposition of silicon thin films for large area electronicsCurrent Opinion in Solid State and Materials Science, 2002
- Hole and electron field-effect mobilities in nanocrystalline silicon deposited at 150 °CApplied Physics Letters, 2002
- Fluorine and hydrogen effects on the growth and transport properties of microcrystalline silicon from SiF4 precursorJournal of Non-Crystalline Solids, 2002
- Polycrystalline Silicon Thin-Film TransistorsSolid State Phenomena, 2001
- Low-Temperature Plasma-Processed Microcrystalline Silicon Thin Films for Large-Area ElectronicsSolid State Phenomena, 2001
- Dangling-bond defect state creation in microcrystalline silicon thin-film transistorsApplied Physics Letters, 2000
- Ethics and computer useCommunications of the ACM, 1995
- Real-time spectroscopic ellipsometry study of the growth of amorphous and microcrystalline silicon thin films prepared by alternating silicon deposition and hydrogen plasma treatmentPhysical Review B, 1995