Simultaneous imaging of the In and As sublattice on InAs(110)-(1×1) with dynamic scanning force microscopy
- 1 February 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 140 (3-4) , 293-297
- https://doi.org/10.1016/s0169-4332(98)00543-1
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperaturesReview of Scientific Instruments, 1998
- Atom-Resolved Image of theSurface by Noncontact Atomic Force MicroscopyPhysical Review Letters, 1997
- Quantitative analysis of the frictional properties of solid materials at low loads. I. Carbon compoundsPhysical Review B, 1997
- Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force MicroscopeJapanese Journal of Applied Physics, 1995
- Atomic-force microscopy on the Si(111)7×7 surfacePhysical Review B, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force MicroscopeJapanese Journal of Applied Physics, 1994
- True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive ForcesScience, 1993
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Atom-selective imaging of the GaAs(110) surfacePhysical Review Letters, 1987