Simultaneous atomic force microscopy measurement of long range forces and adhesion energy between tungsten and oxide surfaces under ambient atmosphere and ultrahigh vacuum

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Abstract
In the field of metal/oxide adhesion, it is contended that long range interactions may contribute to the work of adhesion. The combination of dc and ac atomic force microscopy is shown to provide a quantitative answer to this question by the simultaneous measurement of the long range forces and the adherence force. Different systems are considered: W/MgO under ambient atmosphere, where we show that adhesion is completely accounted for by the capillary force, and W/TiO2 (stoichiometric and nonstoichiometric) under ultrahigh vacuum, where the results suggest that the van der Waals contribution has to be taken into account in the adhesion energy.