Angle resolved X-ray photoelectron spectroscopy of the surface of Hg0.85Zn0.15Te and after passivation processes
- 2 April 1994
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 138 (1-4) , 934-939
- https://doi.org/10.1016/0022-0248(94)90934-2
Abstract
No abstract availableKeywords
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