Prompt and Total Dose Response of Hard 4k and 16k CMOS Static Random Access Memories (SRAMs)
- 1 January 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 31 (6) , 1354-1357
- https://doi.org/10.1109/TNS.1984.4333510
Abstract
No abstract availableKeywords
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