Cosmic Ray Induced Errors in I2L Microprocessors and Logic Devices
- 1 January 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 28 (6) , 3945-3954
- https://doi.org/10.1109/tns.1981.4335653
Abstract
Large scale integrated (LSI) devices fabricated with integrated injection logic (I2L) were studied by both heavy ion experiments asd device analysis to determine the upset threshold, the charge collection volumes and ultimately the probability for upset in the galactic cosmic ray spectrum. The devices studied, the SEP9900A, the SBP9989 and the P-Code generator were fabricated by Texas Instruments, Inc.Keywords
This publication has 4 references indexed in Scilit:
- Cosmic-Ray-Induced Errors in MOS DevicesIEEE Transactions on Nuclear Science, 1980
- Simulation of Cosmic-Ray Induced Soft Errors and Latchup in Integrated-Circuit Computer MemoriesIEEE Transactions on Nuclear Science, 1979
- Radiation Effects Characterization of the SBP9900A 16-Bit MicroprocessorIEEE Transactions on Nuclear Science, 1979
- Second generation I/sup 2/L/MTL: a 20 ns process/structureIEEE Journal of Solid-State Circuits, 1977