Dielectric properties of vacuum deposited cerium oxide films
- 1 July 1984
- journal article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 3 (7) , 600-604
- https://doi.org/10.1007/bf00719623
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Dielectric and electrical properties of SnO2, Sb2O3, and their mixed filmsPhysica Status Solidi (a), 1983
- Dielectric behaviour of lanthanum oxide thin film capacitorsThin Solid Films, 1981
- Steady-state and non-steady-state current flow in thin-film Al-CeF3-Al samplesPhysical Review B, 1975
- Electrical properties of thin-film Al-CeF3-Al capacitorsJournal of Applied Physics, 1975
- Dielectric behaviour of dysprosium oxide filmsThin Solid Films, 1975
- Ionic Conduction in LaThin FilmsPhysical Review B, 1973
- Determination of the defect nature of MoO3 films using dielectric-relaxation currentsJournal of Applied Physics, 1972
- Electrical Properties of Evaporated Molybdenum Oxide FilmsJournal of Applied Physics, 1970
- Alternating Current Electrical Properties of Highly Doped Insulating FilmsJournal of Applied Physics, 1970
- Annealing behaviour in vacuum-deposited films of silicon oxideThin Solid Films, 1968