Determination of the lattice strain and chemical composition of semiconductor heterostructures by high-resolution x-ray diffraction
- 15 April 1996
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 79 (8) , 4101-4110
- https://doi.org/10.1063/1.361773
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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