Ion Beam Processing of Optical Thin Films
- 1 January 1989
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Detection of micrometer-sized pinholes in specularly reflecting filmsReview of Scientific Instruments, 1988
- Computer Simulation Of Substrate Defect Propagation In Thin FilmsPublished by SPIE-Intl Soc Optical Eng ,1988
- Modeling Of Nodular Defects In Thin Films For Various Deposition Techniques.Published by SPIE-Intl Soc Optical Eng ,1988
- Ion-based methods for optical thin film depositionJournal of Materials Science, 1986
- Low-loss waveguiding in ion-assisted-deposited thin filmsApplications of Surface Science, 1985
- Ion-assisted deposition of MgF2 at ambient temperaturesThin Solid Films, 1985
- Multiple determination of the optical constants of thin-film coating materialsApplied Optics, 1984
- Ion beam processing for coating MgF_2 onto ambient temperature substratesApplied Optics, 1984
- Reduction of substrate interference in Raman spectroscopy of submicron titania coatingsApplied Optics, 1984
- Handbook of Thin Film TechnologyJournal of the Electrochemical Society, 1971