An ultrathin buried Si layer in GaAs studied by soft X-ray emission spectroscopy and surface X-ray diffraction: theory and experiment
- 1 May 1999
- journal article
- Published by Elsevier in Journal of Alloys and Compounds
- Vol. 286 (1-2) , 31-36
- https://doi.org/10.1016/s0925-8388(98)00976-1
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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