Reduced critical thickness and photoluminescence line splitting in multiple layers of self-assembled Ge/Si islands
- 1 May 2000
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 74 (1-3) , 248-252
- https://doi.org/10.1016/s0921-5107(99)00570-x
Abstract
No abstract availableKeywords
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