Microstructure of grappe defects in InP
- 1 November 1983
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 64 (1) , 121-128
- https://doi.org/10.1016/0022-0248(83)90258-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Characterisation of defects in InP substratesJournal of Crystal Growth, 1983
- A Study of Inclusions in Indium PhosphideJournal of the Electrochemical Society, 1982
- Nonradiative regions in GaInAsP/InP double heterostructure laser material: correlation with dislocation clusters in the substratesElectronics Letters, 1982
- Dislocation clusters in Czochralski-grown single crystal indium phosphideJournal of Crystal Growth, 1981
- The Detection of Structural Defects in Indium Phosphide by Electrochemical EtchingJournal of the Electrochemical Society, 1981
- Etch features in Czochralski-grown single crystal indium phosphideJournal of Materials Science, 1980
- Dislocation climb model in compound semiconductors with zinc blende structureApplied Physics Letters, 1976