Charge carrier lifetime measurements on high purity silicon
- 1 January 1987
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 253 (3) , 351-359
- https://doi.org/10.1016/0168-9002(87)90516-x
Abstract
No abstract availableKeywords
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