Partial detectability profiles
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Fault sampling revisitedIEEE Design & Test of Computers, 1990
- Statistical TestingPublished by Springer Nature ,1988
- SOCRATES: a highly efficient automatic test pattern generation systemIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Probability models for pseudorandom test sequencesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Pseudorandom TestingIEEE Transactions on Computers, 1987
- Test Length for Pseudorandom TestingIEEE Transactions on Computers, 1987
- On Random Pattern Test LengthIEEE Transactions on Computers, 1984