Improved techniques in multiparameter coincidence experiments

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Abstract
The application of multiparameter techniques, such as position-sensitive detectors, to coincidence experiments has resulted in greatly improved collection efficiency over previously adopted single-channel methods. Often, however, the improvements made in quality of data are limited by an increase in the accidental count rate concomitant with this approach. This increase in background count rate results from the increased singles count rates in the detectors and the degradation in timing resolution due to the simultaneous detection of electrons over a wide energy range. The authors present two methods for reducing this background. Their combined effect was to reduce the accidental coincidence count rate by a factor of almost 20 in the coincidence measurement of (e, 2e) transitions in He in the autoionising region.

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