Adhesive strength of the interface between a metal film and crystalline quartz
- 1 December 1984
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 122 (1) , 59-62
- https://doi.org/10.1016/0040-6090(84)90378-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Observations of Al2O3 and free silicon at the interface between aluminum films and SiO2Thin Solid Films, 1978
- Thin film metallization of oxides in microelectronicsThin Solid Films, 1973
- Scratch Test for Measuring Adherence of Thin Films to Oxide SubstratesReview of Scientific Instruments, 1964