Pulsed bias/pulsed RF characterization measurement system of FET at constant intrinsic voltages
- 5 March 1999
- journal article
- research article
- Published by Wiley in Microwave and Optical Technology Letters
- Vol. 20 (5) , 349-352
- https://doi.org/10.1002/(sici)1098-2760(19990305)20:5<349::aid-mop20>3.0.co;2-u
Abstract
No abstract availableKeywords
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- W-band MMIC characterization in an isothermal environmentIEEE Microwave and Guided Wave Letters, 1995
- A new method for determining the FET small-signal equivalent circuitIEEE Transactions on Microwave Theory and Techniques, 1988
- Relationship between measured and intrinsic transconductances of FET'sIEEE Transactions on Electron Devices, 1987