Measurement of the Energy Distributions of Secondary Ions from Pure Metals and Alloys
- 1 August 1981
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 20 (8) , 1435-1442
- https://doi.org/10.1143/jjap.20.1435
Abstract
Precise measurement of the energy distribution of secondary ions was attempted in order to study the correlation with surface properties. The experiments revealed that the peak of the energy distribution shifts towards the lower energy as the partial pressure of oxygen becomes higher for both Al and Mg under Ar+ ion bombardment. The measurement was then extended to Ni-W and Cu-Ni alloy samples to see whether any difference between the peaks of secondary ions of constituent atoms could be found, the same as those of sputtered Ni- and W-atoms from Ni-W alloy reported by Oechsner et al. The results suggest that no substantial difference exists in the energy distribution of secondary ions of constituent atoms for both the Ni-W and Cu-Ni alloys even though the peak positions of the secondary ions of constituent atoms with higher sublimation energy are always slightly higher.Keywords
This publication has 11 references indexed in Scilit:
- Secondary ion mass spectrometry as a means of surface analysisSurface Science, 1979
- 0.1–10-keV x-ray-induced electron emissions from solids—Models and secondary electron measurementsJournal of Applied Physics, 1977
- A Simple Ion Energy Analyser Equipped with a Quadrupole Mass SpectrometerJapanese Journal of Applied Physics, 1976
- Energy dependence of the secondary ion yield of metals and semiconductorsSurface Science, 1975
- Effets comparés de l'oxygène sur l'émission ionique et le potentiel de surface des métauxSurface Science, 1973
- Velocity Filtering for Secondary Ion Quadrupole Mass SpectrometerReview of Scientific Instruments, 1973
- Study of the mechanism of the negative secondary ionic emission by selective superficial oxidation and adsorptionSurface Science, 1973
- Study on Properties of the Secondary Ions by an Ion Bombardment Mass SpectrographJournal of the Mass Spectrometry Society of Japan, 1973
- Distributions énergétiques des ions secondairesRevue de Physique Appliquée, 1973
- Determination of transmission characteristics in mass filtersJournal of Physics E: Scientific Instruments, 1970