Conductor loss computation in multiconductor MIC's by transverse resonance technique and modified perturbational method
- 1 June 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Microwave and Guided Wave Letters
- Vol. 2 (6) , 250-252
- https://doi.org/10.1109/75.136522
Abstract
Rigorous computation of conductor loss in multiconductor MMIC transmission lines requires high computer expenditures, while conventional approaches become invalid for thin line conductors. Using a modified perturbational method, originally proposed by R. Horton et al. (Electron. Lett., vol.7, no.17, pp.490-91, Aug. 1971), in conjunction with the generalized transverse resonance technique, very accurate results are obtained with relatively modest computer effort.Keywords
This publication has 8 references indexed in Scilit:
- Skin-effect current distribution of a unilateral finline with finite conductivityPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Loss calculation of single and coupled strip lines by extended spectral domain approachIEEE Microwave and Guided Wave Letters, 1993
- Transverse segmentation: a novel technique for the efficient CAD of 2N-port branch-guide couplersIEEE Microwave and Guided Wave Letters, 1991
- Full-wave analysis of conductor losses on MMIC transmission linesIEEE Transactions on Microwave Theory and Techniques, 1990
- Continuous active T-gate travelling-wave transistorElectronics Letters, 1989
- Theoretical and experimental characterization of nonsymmetrically shielded coplanar waveguides for millimeter-wave circuitsIEEE Transactions on Microwave Theory and Techniques, 1989
- Admittance matrix formulation of waveguide discontinuity problems: computer-aided design of branch guide directional couplersIEEE Transactions on Microwave Theory and Techniques, 1988
- Variation of microstrip losses with thickness of stripElectronics Letters, 1971