Comment on ‘Quantitative analyses of RHEED patterns from MBE grown GaAs(001)−2 × 4 surfaces’ by Y. Ma, S. Lordi, P.K. Larsen and J.A. Eades
- 1 April 1994
- journal article
- Published by Elsevier in Surface Science
- Vol. 306 (1-2) , 247-251
- https://doi.org/10.1016/0039-6028(94)91203-3
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Multiple-scattering evaluation of RHEED intensities from the GaAs(001)2×4 surface: Evidence for subsurface relaxationPhysical Review B, 1993
- Quantitative analyses of RHEED patterns from MBE grown GaAs(001)−2 × 4 surfacesSurface Science, 1993
- The structure of the Pt(110)1 × 2 surface and its 1×2 ⇌ 1×1 structural transition I. RHEED from the periodic part of the structureSurface Science, 1992
- The structure of the Pt(110) 1 × 2 surface and its 1 × 2 → 1 × 1 structural transition: II. RHEED from the non-periodic part of the structureSurface Science, 1992
- Analysis of RHEED data from the GaAs(001)2 × 4 surfaceSurface Science, 1992
- Structural study of Si growth on a Si(111)7 × 7 surfaceSurface Science, 1991
- A RHEED study of 1 × n reconstructions of the Pt(110) surfaceSurface Science, 1990
- An efficient multiple parameter evaluation of measured RHDEED rocking curves applied to Pt(111)Surface Science, 1990
- Rheed intensity analysis of Si(111)7 × 7 at one-beam conditionSurface Science, 1987
- A theory of rheedSurface Science, 1981