Determination of lifetime and diffusion constant of minority carriers by a phase-shift technique using an electron-beam-induced current
- 1 May 1981
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 52 (5) , 3428-3432
- https://doi.org/10.1063/1.329116
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
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