Equivalent Circuit Model for Si Avalanche Photodetectors Fabricated in Standard CMOS Process
- 23 September 2008
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 29 (10) , 1115-1117
- https://doi.org/10.1109/led.2008.2000717
Abstract
We present an equivalent circuit model for CMOS-compatible avalanche photodetectors. The equivalent circuit model includes an inductive component for avalanche delay, a current source for photogenerated carriers, and several components that model the device structure and parasitic effects. The model provides accurate impedance characteristics and photodetection frequency responses.Keywords
This publication has 10 references indexed in Scilit:
- Si avalanche photodetectors fabricated in standard complementary metal-oxide-semiconductor processApplied Physics Letters, 2007
- Impact-Ionization-Induced Bandwidth-Enhancement of a Si–SiGe-Based Avalanche Photodiode Operating at a Wavelength of 830 nm With a Gain-Bandwidth Product of 428 GHzIEEE Photonics Technology Letters, 2007
- Millimeter-wave Optoelectronic Mixers Based on CMOS-Compatible Si PhotodetectorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- Enhanced frequency response associated with negative photoconductance in an InGaAs/InAlAs avalanche photodetectorApplied Physics Letters, 2003
- A New Physical RF Model of Junction VaractorsJapanese Journal of Applied Physics, 2003
- Analysis of high speed p-i-n photodiode S-parameters by a novel small-signal equivalent circuit modelIEEE Microwave and Wireless Components Letters, 2002
- Pad de-embedding in RF CMOSIEEE Circuits and Devices Magazine, 2001
- 1-Gb/s integrated optical detectors and receivers in commercial CMOS technologiesIEEE Journal of Selected Topics in Quantum Electronics, 1999
- Small-signal characteristics of a read diode under conditions of field-dependent velocity and finite reverse saturation currentSolid-State Electronics, 1978
- High-speed photodiode signal enhancement at avalanche breakdown voltageIEEE Transactions on Electron Devices, 1965