Cluster Ion Emission from Cesium Chloride Bombarded with Atomic and Molecular Ions
- 1 January 1991
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Effects of primary ion polyatomicity and kinetic energy on secondary ion yield and internal energy in simsInternational Journal of Mass Spectrometry and Ion Processes, 1990
- Secondary-ion yields from surfaces bombarded with keV molecular and cluster ionsPhysical Review Letters, 1989
- Desorption of valine molecular ions using fast incident atomic and polyatomic ionsInternational Journal of Mass Spectrometry and Ion Processes, 1988
- Statistics of sputteringNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Mechanism of sputtering of large biomolecular ions by impact of highly ionizing particlesPhysical Review Letters, 1987
- Secondary ion mass spectra of alkali halidesSurface Science, 1985
- Time-of-Flight Measurements of Cesium-Iodide Cluster IonsPhysical Review Letters, 1983
- Sputtering models—A synoptic viewRadiation Effects, 1983
- Sputtering yield measurementsPublished by Springer Nature ,1981