Micro-PIXE analysis of major elements in mineral specimens
- 1 June 1993
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 74 (4) , 503-510
- https://doi.org/10.1016/0168-583x(93)95947-4
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Quantitative pixe microanalysis of geological matemal using the CSIRO proton microprobePublished by Elsevier ,2002
- Improved model for the intensity of low-energy tailing in Si(Li) x-ray spectraX-Ray Spectrometry, 1991
- An on-demand beam deflection system for microbeam PIXE analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- Accuracy of thick-target micro-PIXE analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- An exact treatment of secondary and tertiary fluorescence enhancement in PIXENuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
- The Guelph PIXE software packageNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989
- Fitted empirical reference cross sections for K-shell ionization by protonsAtomic Data and Nuclear Data Tables, 1989
- Design of a dedicated target chamber for PIXE microanalysis of mineral samplesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectorsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Experimental L-shell x-ray production and ionization cross sections for proton impactAtomic Data and Nuclear Data Tables, 1984