LFSR based deterministic hardware for at-speed BIST
- 31 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Test set embedding in a built-in self-test environmentPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Design of low cost ROM based test generatorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Constant testability of combinational cellular tree structuresJournal of Electronic Testing, 1992
- Hybrid designs generating maximum-length sequencesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- A Minimum Test Set for Multiple Fault Detection in Ripple Carry AddersIEEE Transactions on Computers, 1987
- A Class of Test Generators for Built-In TestingIEEE Transactions on Computers, 1983
- Design for Testability—A SurveyIEEE Transactions on Computers, 1982
- Design for Autonomous TestIEEE Transactions on Computers, 1981
- A Hardware Approach to Self-Testing of Large Programmable Logic ArraysIEEE Transactions on Computers, 1981
- Easily Testable Iterative SystemsIEEE Transactions on Computers, 1973