Broad-Band Noise Mechanisms and Noise Measurements of Metal Semiconductor Junctions
- 1 November 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 34 (11) , 1193-1201
- https://doi.org/10.1109/tmtt.1986.1133516
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
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