Arsenic-doped P-type ZnTe grown by molecular beam epitaxy

Abstract
Efficient p doping of ZnTe by arsenic has been achieved using a Zn3As2 effusion cell. Doping levels of ZnTe/GaAs can be controlled from 1016 to 1018 cm−3. The carrier concentration is independent of the substrate used, ZnTe:As/GaAs and ZnTe:As/InP giving similar results. Spectral photoconductivity and low‐temperature photoluminescence, however, show an increase of deep levels for doping levels higher than 1017 cm−3 but electrical measurements show no saturation for doping as high as 1018 cm−3.