High frequency noise of MOSFETs. II. Experiments

This publication has 6 references indexed in Scilit:

• An improved de-embedding technique for on-wafer high-frequency characterization
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• An assessment of the state-of-the-art 0.5 μm bulk CMOS technology for RF applications
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• High frequency noise of MOSFETs I Modeling
  Solid-State Electronics, 1998
• Direct calculation of metal–oxide–semiconductor field effect transistor high frequency noise parameters
  Journal of Vacuum Science & Technology A, 1998
• Microwave performance of optically fabricated T-gate thin film silicon-on-sapphire based MOSFET's
  IEEE Electron Device Letters, 1995
• MOSFET thermal noise modeling for analog integrated circuits
  IEEE Journal of Solid-State Circuits, 1994