A Further Comment on the Weak-Beam Contrast of Stacking Faults in Silicon
- 16 September 1982
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 73 (1) , K15-K19
- https://doi.org/10.1002/pssa.2210730140
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- On the contrast asymmetry exhibited by intrinsic and extrinsic faults imaged under weak-beam conditionsPhysica Status Solidi (a), 1981
- A comment on the kinematical theory of diffraction contrast of lattice defects on transmission electron microscope images of crystalline specimensPhysica Status Solidi (a), 1981
- Comments on weak-beam contrast of stacking faults in transmission electron microscopy /1/Physica Status Solidi (a), 1981
- Analytical description of the electron microscope diffraction contrast of lattice defects in the two-beam casePhilosophical Magazine A, 1981
- Weak-beam contrast of stacking faults in transmission electron microscopyPhysica Status Solidi (a), 1980
- Defects in electron-irradiated germaniumPhilosophical Magazine, 1976